copy Characterization Lab copy
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- 25 Αυγούστου 2020
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PARK XE7 AFM platform, which Includes the Scanning Kelvin Probe Microscopy (SKPM), Dynamic Contact EFM (DC-EFM) and Piezoresponse Force Microscopy (PFM) modes.
Atomic Force Microscope
PARK XE7 AFM platform, which Includes the Scanning Kelvin Probe Microscopy (SKPM), Dynamic Contact EFM (DC-EFM) and Piezoresponse Force Microscopy (PFM) modes.
Arkeo All in one measurement platform, Cicci Research .
All-in-one electrical measurement platform
Arkeo All in one measurement platform, Cicci Research .
Arkeo All in one measurement platform, Cicci Research .
All-in-one electrical measurement platform
Arkeo All in one measurement platform, Cicci Research .
EnliTech EQE / Photon-Electron Conversion Testing
Quantum Efficiency Setup
EnliTech EQE / Photon-Electron Conversion Testing
All in one analyzer supporting current-voltage (I-V), capacitance-voltage (CV) and pulse/dynamic IV measurements.
Semiconductor analyser
All in one analyzer supporting current-voltage (I-V), capacitance-voltage (CV) and pulse/dynamic IV measurements.
4-probe method for calculating electrical conductivity, mobility & sheet resistance of films under study.
4-point measurement stations
4-probe method for calculating electrical conductivity, mobility & sheet resistance of films under study.
Probe station EPS150TRIAX, Cascade Microtech: Enable I-V measurements at fA level.
Probe Station
Probe station EPS150TRIAX, Cascade Microtech: Enable I-V measurements at fA level.
Probe station EPS150TRIAX, Cascade Microtech: Enable I-V measurements at fA level.
Probe Station with IV tracer
Probe station EPS150TRIAX, Cascade Microtech: Enable I-V measurements at fA level.
PARK XE7 AFM platform, which Includes the Scanning Kelvin Probe Microscopy (SKPM), Dynamic Contact EFM (DC-EFM) and Piezoresponse Force Microscopy (PFM) modes.
Atomic Force Microscope
PARK XE7 AFM platform, which Includes the Scanning Kelvin Probe Microscopy (SKPM), Dynamic Contact EFM (DC-EFM) and Piezoresponse Force Microscopy (PFM) modes.
Infinity PV ISOS test laboratory for testing of PVs under the ISOS-D-1/2/3, ISOS-L-1/2/3, ISOS-O-1/2/3 protocols. 40-channel system used for recording conditions (temperature, light intensity and humidity) and weather data.
Stability measurements platform
Infinity PV ISOS test laboratory for testing of PVs under the ISOS-D-1/2/3, ISOS-L-1/2/3, ISOS-O-1/2/3 protocols. 40-channel system used for recording conditions (temperature, light intensity and humidity) and weather data.
FR Basic, Thetametrisis: Film Characterization (thickness, optical properties), Reflectance measurement tool.
Thickness measurement tool
FR Basic, Thetametrisis: Film Characterization (thickness, optical properties), Reflectance measurement tool.
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